SIDEA,Next Generation 12" Full-Auto Prober,Electronic equipment & Instruments
SUMEC INTERNATIONAL TECHNOLOGY CO.,LTD
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SIDEA,Next Generation 12" Full-Auto Prober,Electronic equipment & Instruments
SUMEC INTERNATIONAL TECHNOLOGY CO.,LTDThe supplier hasn’t listed a price. We can get their current prices and MOQ.
Verify from $29 · written report in 3 business days · 100% refund if unreachable
About this product
- Size: ·
- Color: ·
- Process: Other
- Voltage: Other
- Processing material: Other
- Customized: CustomizedOther
- Exports to: Mainland China, Africa, Middle East, Central Asia, USA and Canada, EU
About this product
- Size: ·
- Color: ·
- Process: Other
- Voltage: Other
- Processing material: Other
- Customized: CustomizedOther
- Exports to: Mainland China, Africa, Middle East, Central Asia, USA and Canada, EU
Product details
| Size | · |
|---|---|
| Color | · |
| Process | Other |
| Voltage | Other |
| Processing material | Other |
| Customized | CustomizedOther |
| Composition | Other |
Product details
| Size | · |
|---|---|
| Color | · |
| Process | Other |
| Voltage | Other |
| Processing material | Other |
| Customized | CustomizedOther |
| Composition | Other |
From the supplier
The 12-inch fully automatic probe station with high precision, high efficiency, low vibration and low noise is 50% more efficient and 30% more accurate than the previous generation of equipment.
Precision optical modules and advanced image algorithms to achieve automatic alignment, automatic needle alignment.
Wafer ID reading support (front/back optional).
The parameters and functions are comparable to the first-class in the world.
Inherit the excellent performance and easy operability of the previous generation of equipment.
Automatic docking of OHT and AGV.
Adapt to the hardware and software connection of the mainstream test system in the market.
Adapt to Hard Docking/Direct Docking/Cable test of various types of test systems.
From the supplier
The 12-inch fully automatic probe station with high precision, high efficiency, low vibration and low noise is 50% more efficient and 30% more accurate than the previous generation of equipment.
Precision optical modules and advanced image algorithms to achieve automatic alignment, automatic needle alignment.
Wafer ID reading support (front/back optional).
The parameters and functions are comparable to the first-class in the world.
Inherit the excellent performance and easy operability of the previous generation of equipment.
Automatic docking of OHT and AGV.
Adapt to the hardware and software connection of the mainstream test system in the market.
Adapt to Hard Docking/Direct Docking/Cable test of various types of test systems.
About the supplier
- ✓Exhibited at 2 recent Canton Fairs
- ✓Foreign Trade Company
- ✓Founded 1999
- ✓1 certificate on file
- Exhibited at 2 recent Canton Fairs
- Foreign Trade Company
- Founded 1999
- 1 certificate on file
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